Labsphere Solutions Spotlighted at Photonics West 2008

Light metrology instruments, and reflective materials on display from leader in light testing and measurement

North Sutton, New Hampshire (December 20, 2007) – Labsphere, Inc., a leader in light metrology, will be presenting its line of light metrology instruments and reflective materials and coatings during the SPIE Photonics West 2008 conference and exhibition January 22-24, 2008 at the McHenry Convention Center (San Jose, Calif.).  In addition to regular product displays at booth number 237, the company will be hosting an applications solution demonstration and offering personalized one-on-one consults at its booth.

Labsphere light metrology and reflective materials and coatings products on display will include new solutions for LED and SSL test and measurement, the new USS-800C, one of a series of uniform radiance source systems for digital camera calibration, and Spectralon® and Spectraflect® coating examples.  Labsphere’s diffuse reflectance materials can be applied to customer-supplied parts, or complete components can be designed and machined to specification.  Labsphere’s strength is in customizing its instruments, and materials and coatings products, based on customer requirements.

Application engineers will be on hand to discuss custom solutions.  Personalized half hour consultations can be booked in advance of the show by contacting Labsphere at  In addition, the company will host a presentation entitled “Labsphere Solutions for your Application” Thursday, January 24 at 11:30 am in the Opto Town Square One Demo area.

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