Labsphere’s Solar Spectrum System Simulates Solar Radiation

Industry’s first uniform source system for testing and calibration of sunlight/daylight conditions

North Sutton, New Hampshire (October 4, 2007) – Light metrology experts at Labsphere have made it possible to generate a uniform radiance field simulating the spectral shape of solar light with the Solar Spectrum Uniform Source system.  As testing and calibration demands change for increasingly portable display and imaging capabilities, this industry-first, extended uniform source can be used in applications requiring the replication of sunlight and daylight conditions.

 Solar Spectrum Uniform Source

Designed for Lambertian solar simulation testing of high speed video and film systems, space-based imaging systems, single element broadband sensors, photovoltaic and quantum efficiency, as well as dynamic range, linearity and uniformity testing of focal plane arrays, the Solar Spectrum Uniform Source duplicates the spectral shape of solar radiation with xenon and tungsten halogen sources and an integrating sphere.  The system is capable of approximating the spectral radiance of a 100% albedo source, or the spectral curve of the ASTM Standard D65. 

With a radiance uniformity of more than 98%, the Solar Spectrum Uniform Source also approximates near blackbody spectrums with color temperature ranges from 3000 K to 6000 K.  The system includes a photopic detector for luminance monitoring, a high-dynamic range, low-noise CCD-based spectrometer to monitor spectral irradiance from 350 nm to 1050 nm, spectrometer and uniform source control software, and multiple detector options.  It is available in two models to meet customer output radiance and illumination area requirements. 

Variable attenuaters and motor controllers allow users to automatically control spectral radiance through the exit port.  Luminance levels are monitored in candelas per square meter (cd/m2) and foot-Lamberts (fL), and calibrations are traceable to the National Institute of Standard and Technology (NIST).

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