SPIE More than Exhibition for Labsphere
Company experts to present five educational papers on light measurement topics.
North Sutton, New Hampshire (June 27, 2007) – Labsphere will be showing its complete line of light metrology solutions, along with the company’s engineering and applications expertise at the SPIE Optics & Photonics conference and exhibition August 28-30 at the San Diego Convention Center (San Diego, Calif.). In addition to an exhibit at booth 510 including light measurement systems, sensor calibration equipment and advanced Spectralon® materials and coatings, the company will present papers covering a diverse range of light metrology topics.
New at the show will be the company’s Starter and Choice package components for fast, accurate light test calibration and measurements in research, development and production settings. Packages are available for broad applications, or individual components may be selected to build an application specific package. For backlight panel displays, laser cavities, medical imaging, and targets, Labsphere’s Spectralon and other diffuse reflectance materials can be applied to customer-supplied parts, or complete components can be designed, fabricated, tested and calibrated to customer specifications. A sampling of components from across the company’s product lines will be on display, and applications engineers will be on hand to discuss custom solutions.
Labsphere’s experienced engineering staff has established an industry-wide reputation for its knowledge and innovation, often collaborating with customers to develop custom light test solutions. The company will share some of this knowledge during the conference technical program (detailed below).
- Optimization of Spectralon through numerical modeling and improved processes
Paper 6666-4 of Conference 6666; Sunday, August 26, 2007 - Linearity improvement in a high dark-current near-infrared array spectrometer
Paper 6677-11 of Conference 6677; Sunday, August 26, 2007 - Design and characterization of a large area uniform radiance source for calibration of a remote sensing imaging system
Paper 6677-5 of Conference 6677; Sunday, August 26, 2007 - Increased efficiency and performance in laser pump chambers through use of diffuse highly reflective materials
Paper 6663-24 of Conference 6663; Wednesday, August 29, 2007 - Performance improvements in back panel display lighting using near Lambertian diffuse high-reflectance materials
Paper OP07OWK1-3 of Conference OP07OWK1; Thursday, August 30, 2007
For more information on Labsphere products and services, visit booth 510 at the SPIE show.
